Institución

 Neocera LLC Magnetic Field Imaging

Estamento

Director de I+D

Departamento

 División de Microscopía Magnética

ORCID

0000-0002-6853-6798

Scopus-ID

7003829424

H-Index

7

Artículos JCR

29

Citas totales

500

25

–

• A. Orozco, F. Rusli, C. Rowlett, B. Zee, W. Qiu, J.M. Chin and Fang-Jie Foo, ”3D Fault Isolation in 2.5D Device Comprising High Bandwidth Memory (HBM) Stacks and Processor Unit Using 3D Magnetic Field Imaging“, proceedings of the 42nd International Symposium for Testing and Failure Analysis, 2016.
• A. Orozco, F. C. Wellstood and R. Dias, “Advances in 3D Interconnect Characterization Techniques for Fault Isolation and Defect Imaging”, in ”Metrology and Diagnostic Techniques for Nanoelectronics“, Z. Ma and D. G. Seiler Eds., Pan Stanford Publishing (2016). ISBN: 978-981-4745-08-6.
• J. Gaudestad, A. Orozco. “Magnetic Field Imaging for non-destructive 3D IC testing” Microelectron. Reliab. 27 (2014), 044032.
• V. V. Talanov, N.M. Lettsome Jr, V. Borzenets, N. Gagliolo, A.B. Cawthorne, A. Orozco. “A scanning SQUID microscope with 200 MHz bandwidth” Supercond. Sci. Tech. 27 (2014), 044032.
• D. C. Leitao, J. Borme, A. Orozco, S. Cardoso and P. P. Freitas, Magnetoresistive sensors for Surface Scanning, in Giant Magnetoresistive (GMR) Sensors. From Basis to State-of- the-Art Applications. Smart sensors, Measurement and Instrumentation Series, Volume 6. Springer-Verlag, Berlin (2013) pp. 275-299. ISBN:978-3-642-37171-4.

• #FA8650-11-C-7101: “Magnetic Field Imaging for Stacked Chip 3D Fault Isolation” en IARPA-funded CAT program. Duración: 2010-2014. I.P: Antonio Orozco.
• SBIR Phase I-0539355: “Improvements in Reliability of Semiconductor Products Using Magnetic Current Imaging for Fault Isolation of Open Circuits”. Duración: Enero 2006-Junio 2006. I.P: Antonio Orozco.
• STTR Phase I-0638011: “Scanning Magnetic Microscope using a Ferromagnetic Flux-Guide Coupled to a SQUID for Nanoscale Current Imaging of Integrated Circuits”. Duración: Enero 2007-Diciembre 2007. I.P: Antonio Orozco.
• SBIR Phase I-0810388: “Fault Isolation of Open Circuits in Semiconductor Products using Magnetic Current Imaging”. Duración: Julio 2008-Diciembre 2008. I.P: Antonio Orozco.
• SBIR Phase II-0924610: “Fault Isolation of Open Circuits in Semiconductor Products using Magnetic Current Imaging”. Duración: 2009-2011. I.P: Antonio Orozco.

• Patente nº 7019521: “Fault isolation of circuit defects using comparative magnetic field imaging”. Inventores: Antonio Orozco, Elena Talanova, Alfred Benjamin Cawthorne, Lee Knauss, Thirumalai Venkatesan. Año de registro: 2006. País: EEUU. Entidad: Neocera, LLC.
• Patente nº 9529035: “Method and system for localization of open defects in electronic devices with a DC squid based RF magnetometer”. Inventores: Antonio Orozco, Vladimir V. Talanov, Alfred Benjamin Cawthorne, Nicholas Eric Gagliolo. Año de registro: 2016. País: EEUU. Entidad: Neocera, LLC.
• Patente nº 9476951: “DC SQUID based RF magnetometer operating at a bandwidth of 200 MHz and higher”. Inventores: Antonio Orozco, Vladimir V. Talanov, Alfred Benjamin Cawthorne, Nesco Mario Lettsome Jr. Año de registro: 2016. País: EEUU. Entidad: Neocera, LLC.

• Miembro de la Sociedad Americana de Física (APS).
• Miembro de la Sociedad de Análisis de Fallos en Dispositivos Electrónicos (EDFAS).