Description of the infrastructure:

SEM microscope with focused ion beam barrel .

Services currently offered and possible applications in other fields:

• Preparation of electron-transparent samples for electron microscopy of materials and devices.
• Nano-machining using FIB materials and devices.
• Preparation of samples in the form of nano-needles for analysis bay electron tomography and atomic probe, as well as for other application that require this sample geometry.
• Handling of samples of different materials at the micro and nano scale, including cuts in the material by ionic attack, carbon or platium deposition, transfer of material portions to grids, etc.
• Analysis of materials using secondary electrons and ion beams.
• 3D ion beam analysis of the distribution of precipitates or other inclusions in materials uns devices by tomographic reconstruction.
• Other specific operations that require the use of focused ion beams, specifically defined by the petitioner of the service.

Is it necessary to use a technician: yes.  Have a technician: yes.

Observations

The equipment is used by an IMETMAT technician, a technician hired by a project, doctoral students and authorized PDI.