Description of the infrastructure:
Probe type mechanical profilometer with measuring tips: 50nm, 0.7 microns and 12.5 microns. Vertical resolution 1 nm.
Services currently offered and possible applications in other fields:
Layer thickness measurement. Roughness measurement. Measurement of textures. Analysis of spatial frecuencies.
Is it necessary to use a technician: no. Have a technician: no
Observations
The service is aimed at all those professionals who need results of surface metrologu based on probes, mainly related to the shaping and /or machining of materials (molding, cutting), surface treatments (chemical attacks, abrasion, polishing), application of layers or coatings (paints, deposition of layers), quality control of machining tools, with order accuracies up to 1nm (depending on the measurement mode) and samples of size up to 30 cm.