Cookies Policy

The website of the University of Cádiz uses its own and third-party cookies to carry out analysis of use and measurement of traffic, as well as to allow the correct functioning in social networks, and in this way to improve your browsing experience.

If you want to configure cookies, press the button Customize Cookies. You can also access the cookie settings at any time from the corresponding link in the footer.

For more information about cookies you can consult the Cookies policy from the website of the University of Cádiz.

Cookies customization

The website of the University of Cádiz uses its own and third-party cookies to carry out analysis of use and measurement of traffic, as well as to allow the correct functioning in social networks, and in this way to improve your browsing experience.

For more information about cookies you can consult the Cookies policy from the website of the University of Cádiz. You can also access the cookie settings at any time from the corresponding link in the footer.

You can configure the website cookies according to their purpose:

  • Statistical analysis

    Third-party cookies (Google Analytics) are used on this site that allow the number of users to be quantified anonymously (personal data will never be obtained to identify the user) and thus be able to analyze the use made by users of our service, in order to improve the browsing experience and offer our content optimally.

  • Social networks

    Third-party cookies are used on this website that allow the proper functioning of some social networks (mainly YouTube and Twitter) without using any personal data of the user.

UniversidaddeCádiz
Instituto Universitario de Investigación en Microscopía Electrónica y Materiales IMEYMAT

Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

Description of the infrastructure:

Atomic Force Microscope (AFM)

 

Services currently offered and possible applications in other fields:

Contact mode and intermittent contact topography for 3D imaging of surfaces using atomic force microscopy (AFM), magnetic force microscopy (MFM), and thermal scanning microscopy (SThM),  with nanomtric resolution (up to um in vertical resolution and up to 100  um x 100  um in terms of scan size). Determination of surface roughness in this dimensional range.  Determination of the size and shape of nano-sized structures, with a lower limit determined by the size of the probe used (minimum  2 nm). Determination and location of magnetic nanometric objects located on a surface of a non-magnetic material, using MFM. Determination of size and shape  of regions of different thermal conductivity on a low rough surface, based on SThM. In addition, these techniques can be used to study biological systems (cells, cellular structures, macromolecules, etc) as long  as the entities can be deposited on flat support (glass, mica. etc.) and that their size does not exceed team boundaries.

 

 

*Rates exclude the price of AFM tips. The user may provide their own tips, as long as they are compatible with the microscope and the technique or mode of work required. Alternatively, the tips necessary to carry out the experiments may be purchased at the SPI itself (subject to availability). In this case, the tips would remain in the possession of the user, upon payment of their cost. As a guide, some tip prices offered by the microscope manufacturer (Bruker) for different working modes are indicated below:

 

For other types of tips with improved performance or for other advanced working modes, the acquisition prices of the probes should be previously consulted with the technician or scientific manager of the peripheral service.

 

Is it necessary to use a technician: no.  Have a technician: no

Self-employed users will be considered those who have successfully completed the training course offered by the SPI AFM/STM. This training course costs €100.

 

Observations

It is considered that an average work session  usually  lasts approximately 3 hours. The final result of a ssesion will always be an image or set of images of the  sample studied. The technical report, which can be requested additionally, will include the team managers’s interpretation of the images obtained during the session, providing data such as roughness, the size of the structures present, etc.