Member Profile

Updated September 11, 2019

Posted September 11, 2019

Emilio José Márquez Navarro

Full Professor

Applied Magnetism and Optics

Condensed Matter Physics

0000-0002-1846-7413

24464059200

emilio.marquez@uca.es

956016318

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Articles published during the period 2017 - 2021.

1.- FURTHER INCREASING THE ACCURACY OF CHARACTERIZATION OF A THIN DIELECTRIC OR SEMICONDUCTOR FILM ON A SUBSTRATE FROM ITS INTERFERENCE TRANSMITTANCE SPECTRUM

2021 - Materials, Vol.14, Issue 16, pp 4681(1)-4681(17)

Minkov, D.; Marquez, E.; Angelov, G.; Gavrilov, G.; Ruano, S.; Saugar, E.;

JCR Factor

3.623

JCR

Rank Cat.

17/80

Cat. JCR

METALLURGY & METALLURGICAL ENGINEERING

Percentile JCR

79.375

SJR Factor

0.682

CiteScore

Rank Cat.

135/411

Cat. ASJC

CONDENSED MATTER PHYSICS

CiteScore

4.2

SNIP

1.261

DOI: 10.3390/ma14164681

2.- OPTICAL CHARACTERIZATION OF H-FREE A-SI LAYERS GROWN BY RF-MAGNETRON SPUTTERING BY INVERSE SYNTHESIS USING MATLAB: TAUC–LORENTZ–URBACH PARAMETERIZATION

2021 - Coatings, Vol.11, Issue 11, pp 1324(1)-1324(26)

Márquez, E.; Ruíz-Pérez, J.J.; Ballester, M.; Márquez, A.P.; Blanco, E.; Minkov, D.; Fernández Ruano, S.M.; Saugar, E.;

JCR Factor

2.881

JCR

Rank Cat.

70/160

Cat. JCR

PHYSICS, APPLIED

Percentile JCR

56.562

SJR Factor

0.484

CiteScore

Rank Cat.

122/292

Cat. ASJC

MATERIALS CHEMISTRY

CiteScore

SNIP

0.998

DOI: 10.3390/coatings11111324

3.- SPECTROSCOPIC ELLIPSOMETRY STUDY OF NON-HYDROGENATED FULLY AMORPHOUS SILICON FILMS DEPOSITED BY ROOM-TEMPERATURE RADIO-FREQUENCY MAGNETRON SPUTTERING ON GLASS: INFLUENCE OF THE ARGON PRESSURE

2020 - Journal of Non-Crystalline Solids, Vol.547, Issue 2020, pp 120305[1]-120305[12]

Márquez, E.; Blanco, E.; García-Vázquez, C.; Díaz, J.M.; Saugar, E.;

JCR Factor

3.531

JCR

Rank Cat.

5/29

Cat. JCR

MATERIALS SCIENCE, CERAMICS

Percentile JCR

84.483

SJR Factor

0.764

CiteScore

Rank Cat.

47/292

Cat. ASJC

MATERIALS CHEMISTRY

CiteScore

5.6

SNIP

1.243

DOI: 10.1016/j.jnoncrysol.2020.120305

4.- PERFECTING THE DISPERSION MODEL FREE CHARACTERIZATION OF A THIN FILM ON A SUBSTRATE SPECIMEN FROM ITS NORMAL INCIDENCE INTERFERENCE TRANSMITTANCE SPECTRUM

2020 - Thin Solid Films, Vol.706, Issue 7:2020, pp 137984[1]-137984[11]

Minkov, D.A.; Angelov, G.V.; Nestorov, R.N.; Márquez, E.;

JCR Factor

2.183

JCR

Rank Cat.

94/160

Cat. JCR

PHYSICS, APPLIED

Percentile JCR

41.562

SJR Factor

0.544

CiteScore

Rank Cat.

30/153

Cat. ASJC

METALS AND ALLOYS

CiteScore

3.8

SNIP

0.791

DOI: 10.1016/j.tsf.2020.137984

5.- OPTICAL TRANSMITTANCE FOR STRONGLY-WEDGE-SHAPED SEMICONDUCTOR FILMS: APPEARANCE OF ENVELOPE-CROSSOVER POINTS IN AMORPHOUS AS-BASED CHALCOGENIDE MATERIALS

2020 - Coatings, Vol.10, Issue 11, pp 1-23

Ruiz-Pérez, J.J.; Navarro, E.M.;

JCR Factor

2.881

JCR

Rank Cat.

70/160

Cat. JCR

PHYSICS, APPLIED

Percentile JCR

56.562

SJR Factor

0.484

CiteScore

Rank Cat.

122/292

Cat. ASJC

MATERIALS CHEMISTRY

CiteScore

SNIP

0.998

DOI: 10.3390/coatings10111063

6.- THE INFLUENCE OF Ar PRESSURE ON THE STRUCTURE AND OPTICAL PROPERTIES OF NON-HYDROGENATED A-Si THIN FILMS GROWN BY RF MAGNETRON SPUTTERING ONTO ROOM-TEMPERATURE GLASS SUBSTRATES

2019 - Journal of Non-Crystalline Solids, Vol.517, Issue -, pp 32-43

Márquez, E.; Saugar, E.; Díaz, J.M.; García-Vázquez, C.; Fernández-Ruano, S.M.; Blanco, E.; Ruiz-Pérez, J.J.; Minkov, D.A.;

JCR Factor

2.929

JCR

Rank Cat.

4/28

Cat. JCR

MATERIALS SCIENCE, CERAMICS

Percentile JCR

87.5

SJR Factor

0.712

CiteScore

Rank Cat.

52/287

Cat. ASJC

MATERIALS CHEMISTRY

CiteScore

4.8

SNIP

1.234

DOI: 10.1016/j.jnoncrysol.2019.04.034

7.- COMPARATIVE STUDY OF THE ACCURACY OF CHARACTERIZATION OF THIN FILMS A-Si ON GLASS SUBSTRATES FROM THEIR INTERFERENCE NORMAL INCIDENCE TRANSMITTANCE SPECTRUM BY THE TAUC-LORENTZ-URBACH, THE CODY-LORENTZ-URBACH, THE OPTIMIZED ENVELOPES AND THE OPTIMIZED GRAPHICAL METHODS

2019 - Materials Research Express, Vol.6, Issue 3, pp 36410

Minkov, D.A.; Angelov, G.V.; Nestorov, R.N.; Márquez, E.; Blanco, E.; Ruiz-Perez, J.J.;

JCR Factor

1.929

JCR

Rank Cat.

203/314

Cat. JCR

MATERIALS SCIENCE, MULTIDISCIPLINARY

Percentile JCR

35.51

SJR Factor

0.365

CiteScore

Rank Cat.

73/152

Cat. ASJC

METALS AND ALLOYS

CiteScore

1.5

SNIP

0.661

DOI: 10.1088/2053-1591/aaf546

8.- INSIGHTS INTO THE ANNEALING PROCESS OF SOL-GEL TiO₂ FILMS LEADING TO ANATASE DEVELOPMENT: THE INTERRELATIONSHIP BETWEEN MICROSTRUCTURE AND OPTICAL PROPERTIES

2018 - Applied Surface Science, Vol.439, Issue -, pp 736-748

Blanco, E.; Domínguez, M.; González-Leal, J.M.; Márquez, E.; Outón, J.; Ramírez-del-Solar, M.;

JCR Factor

5.155

JCR

Rank Cat.

1/20

Cat. JCR

MATERIALS SCIENCE, COATINGS & FILMS

Percentile JCR

97.5

SJR Factor

1.115

CiteScore

Rank Cat.

27/398

Cat. ASJC

CONDENSED MATTER PHYSICS

CiteScore

7.5

SNIP

1.352

DOI: 10.1016/j.apsusc.2018.01.058

9.- OPTIMISATION OF THE ENVELOPE METHOD FOR CHARACTERISATION OF OPTICAL THIN FILM ON SUBSTRATE SPECIMENS FROM THEIR NORMAL INCIDENCE TRANSMITTANCE SPECTRUM

2018 - Thin Solid Films, Vol.645, Issue -, pp 370-378

Minkov, D.A.; Gavrilov, G.M.; Angelov, G.V.; Moreno, J.M.D.; Vazquez, C.G.; Ruano, S.M.F.; Márquez, E.;

JCR Factor

1.888

JCR

Rank Cat.

74/148

Cat. JCR

PHYSICS, APPLIED

Percentile JCR

50.338

SJR Factor

0.531

CiteScore

Rank Cat.

28/150

Cat. ASJC

METALS AND ALLOYS

CiteScore

3.6

SNIP

0.837

DOI: 10.1016/j.tsf.2017.11.003

10.- EFFECT OF DILUTE Zn⁺² DOPING ON OPTICAL PROPERTIED OF CdTe THIN FILMS

2017 - International Journal of New Horizons in Physics , Vol.4, Issue 1, pp 9-13

Márquez, E.; Shaaban, E.R.; Abdel-Rahman, M;

JCR Factor

JCR

Rank Cat.

-/-

Cat. JCR

Percentile JCR

SJR Factor

CiteScore

Rank Cat.

-/-

Cat. ASJC

CiteScore

SNIP

DOI: 10.18576/ijnhp/040102

11.- OPTICAL CHARACTERIZATION OF AMINE-SOLUTION-PROCESSED AMORPHOUS AsS₂ CHALCOGENIDE THIN FILMS BY THE USE OF TRANSMISSION SPECTROSCOPY

2017 - Journal of Alloys and Compounds, Vol.721, Issue -, pp 363-373

Márquez, E.; Díaz, J.M.; García-Vázquez, C.; Blanco, E.; Ruiz-Pérez, J.J.; Minkov, D.A.; Angelov, G.V.; Gavrilov, G.M.;

JCR Factor

3.779

JCR

Rank Cat.

4/75

Cat. JCR

METALLURGY & METALLURGICAL ENGINEERING

Percentile JCR

95.333

SJR Factor

1.02

CiteScore

Rank Cat.

42/577

Cat. ASJC

MECHANICAL ENGINEERING

CiteScore

5.7

SNIP

1.403

DOI: 10.1016/j.jallcom.2017.05.303

12.- OPTIMIZATION OF THE GRAPHICAL METHOD OF SWANEPOEL FOR CHARACTERIZATION OF THIN FILM ON SUBSTRATE SPECIMENS FROM THEIR TRANSMITTANCE SPECTRUM

2017 - Measurement Science and Technology, Vol.28, Issue 3, pp 35202

Minkov, D.A.; Gavrilov, G.M.; Moreno, J.M.D.; Vazquez, C.G.; Márquez, E.;

JCR Factor

1.685

JCR

Rank Cat.

31/86

Cat. JCR

ENGINEERING, MULTIDISCIPLINARY

Percentile JCR

64.535

SJR Factor

0.53

CiteScore

Rank Cat.

99/443

Cat. ASJC

APPLIED MATHEMATICS

CiteScore

SNIP

1.095

DOI: 10.1088/1361-6501/aa54f6

13.- DEVELOPMENT OF ALGORITHM FOR COMPUTER DRAWING ENVELOPES OF INTERFERENCE REFLECTANCE SPECTRA FOR THIN FILM SPECIMENS

2017 - Optik, Vol.132, Issue -, pp 320-328

Minkov, D.A.; Gavrilov, G.M.; Márquez, E.; Ruano, S.M.F.; Stoynova, A.V.;

JCR Factor

1.191

JCR

Rank Cat.

66/94

Cat. JCR

OPTICS

Percentile JCR

30.319

SJR Factor

0.346

CiteScore

Rank Cat.

280/666

Cat. ASJC

ELECTRICAL AND ELECTRONIC ENGINEERING

CiteScore

2.1

SNIP

0.713

DOI: 10.1016/j.ijleo.2016.12.063